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Tri-Layer Structures Subjected to Combined Temperature and Mechanical Loadings

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2 Author(s)
E. H. Wong ; Singapore Inst. of Manuf. Technol., Singapore ; C. K. Wong

Thermal stress has been a concern in electronic packaging for decades. More recently, mechanical bending of printed circuit board (PCB) assembly has attracted increased interest due to the drop impact failure of interconnects in mobile products. Analytical solutions are available in the literatures for a PCB assembly modeled as a tri-layer structure, consisting of IC components, PCBs, and an interconnect layer, subjected to either thermal stress or mechanical bending, but there are no known reports for combined loadings. This paper presents a comprehensive treatment for a PCB assembly subjected to combined temperature and mechanical loadings, taking into account the axial, shear, and flexural deformation of the interconnects. Solutions are provided for two types of interconnect layer: one in which the interconnect layer is made of a continuous element such as adhesive, and another in which the interconnect layer is made of discrete elements such as solder joints. The solutions were successfully validated with finite-element analysis, and design analyses were performed for both types of interconnect layers.

Published in:

IEEE Transactions on Components and Packaging Technologies  (Volume:31 ,  Issue: 4 )