By Topic

A compact and low-power SRAM with improved read static noise margin

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Cihun-Siyong Alex Gong ; Department of Electrical Engineering, National Central University, Taiwan, R.O.C. ; Ci-Tong Hong ; Kai-Wen Yao ; Muh-Tian Shiue
more authors

An efficient static random access memory (SRAM) is presented in this paper. By using a newly developed architecture based on ldquopreequalizerdquo scheme, the geometry ratio between the pull-up and pull-down driver transistors of conventional 6-T cell will be similar to that of familiar inverter, thereby making the SRAM be provided with an improved read static noise margin (SNM) and a reduced cell area. The removal of DC path resulting from preequalize also yields significant power reduction. To avoid a write speed degradation caused by the internal race on cell current between the pull-up driver transistor and access transistor, a write-power-off scheme is proposed. To further decrease the write power consumption, data drivers are connected to the bit lines instead of the conventional power supply terminals. A 4-kb-capacity test prototype has been designed in a 0.18-mum CMOS process. Achievable power reduction for the proposed SRAM is approximately 16% according to the post-layout simulation results (with the parasitics extracted), compared to that designed in the conventional architecture.

Published in:

Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on

Date of Conference:

Aug. 31 2008-Sept. 3 2008