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In this paper, we propose an efficient test environment for template based asynchronous circuits. This test environment consists of two major parts: fault simulation and test pattern generation. The fault simulation is based on exploring fault effect on quasi-delay insensitive asynchronous circuits that detects any changes in sequences of predefined signals. The test pattern generation is a high level method based on signal transition graph. The effectiveness of the proposed test environment is shown by experimental results on a set of benchmarks given in the form of templates.