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The knowledge of the electroactive and magnetoactive properties of the lanthanum strontium manganite (LSMO) ferromagnetic thin film materials is essential for modeling and design of their devices. The activity of these materials can be described by their electro- and magnetoresistances. Under electrostatic bias field, it is assumed that induced electric current will modify the electrical behavior of the electrode-manganite interface, resulting in the decrease of film resistance. This letter takes a close look at modeling the change of LSMO resistance with working frequency and applied bias.