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Error model identification on digital map of TAN system based on EKF

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2 Author(s)
Wei Wang ; Dept. of Acoust. Control., Beijing Univ. of Aeronaut. & Astronaut., China ; Zhe Chen

In terrain-aided navigation (TAN) system based on extended Kalman filtering (EKF), the digital elevation map (DEM) data are used to update the inertial navigation system (INS). In this paper three error sources are related to DEM by the modelling of TAN system, acquired and discussed in a given terrain area, these errors are smooth stochastic processes modelled as ARMA (1,0) or ARMA (2,0) except for the nonsmooth stochastic process of terrain stochastic linearization (TSL) with adaptive fit technology. The augmented TAN systems are modelled and simulated. All the results of this paper can be used to improve TAN system accuracy

Published in:

Industrial Technology, 1994., Proceedings of the IEEE International Conference on

Date of Conference:

5-9 Dec 1994