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Analysis of Power Management Strategies for a Large-Scale SoC Platform in 65nm Technology

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4 Author(s)

Leakage power has become a major concern in nanometer technologies (65 nm and beyond), and new strategies are being proposed to overcome the limitations of traditional dynamic voltage and frequency scaling (DVFS) and shutdown (SD) approaches in dealing with leakage power and with its strong dependency on temperature and process variations. Even though many researchers have proposed effective point-solutions to these issues, a detailed analysis of their impact on a commercial large-scale multimedia SoC platform is still missing. This paper presents an explorative and comparative analysis of DVFS and SD power management options on a multi-million-gate SoC in 65 nm technology, and provides methodology directions and design insights.

Published in:

Digital System Design Architectures, Methods and Tools, 2008. DSD '08. 11th EUROMICRO Conference on

Date of Conference:

3-5 Sept. 2008