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Diffusivity of Cu Ions in Solid Electrolyte and Its Effect on the Performance of Nanometer-Scale Switch

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7 Author(s)
Banno, N. ; Device Platforms Res. Labs., NEC Corp., Sagamihara ; Sakamoto, T. ; Iguchi, Noriyuki ; Sunamura, H.
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A novel solid-electrolyte nonvolatile switch that we previously developed for programmable large-scale-integration circuits turns on or off when a conducting Cu bridge is formed or dissolved in the solid electrolyte. Cu+ ion migration and an electrochemical reaction are involved in the switching process. For logic applications, we need to adjust its turn-on voltage (V ON), which was too small to maintain the conductance state during logic operations. In this paper, we clarified that V ON is mainly affected by the rate of Cu+ ion migration in the solid electrolyte. Considering the relationship between the migration rate and V ON, we replaced the former electrolyte, Cu2-alphaS, with Ta2O5, which enabled us to appropriately adjust V ON with a smaller Cu+ ion diffusion coefficient.

Published in:

Electron Devices, IEEE Transactions on  (Volume:55 ,  Issue: 11 )

Date of Publication:

Nov. 2008

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