By Topic

An Improved Curvature Scale-Space Corner Detector and a Robust Corner Matching Approach for Transformed Image Identification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Awrangjeb, M. ; Gippsland Sch. of Inf. Technol., Monash Univ., Churchill, VIC ; Guojun Lu

There are many applications, such as image copyright protection, where transformed images of a given test image need to be identified. The solution to this identification problem consists of two main stages. In stage one, certain representative features, such as corners, are detected in all images. In stage two, the representative features of the test image and the stored images are compared to identify the transformed images for the test image. Curvature scale-space (CSS) corner detectors look for curvature maxima or inflection points on planar curves. However, the arc-length used to parameterize the planar curves by the existing CSS detectors is not invariant to geometric transformations such as scaling. As a solution to stage one, this paper presents an improved CSS corner detector using the affine-length parameterization which is relatively invariant to affine transformations. We then present an improved corner matching technique as a solution to the stage two. Finally, we apply the proposed corner detection and matching techniques to identify the transformed images for a given image and report the promising results.

Published in:

Image Processing, IEEE Transactions on  (Volume:17 ,  Issue: 12 )