Cart (Loading....) | Create Account
Close category search window
 

Influence of Pump-to-Signal RIN Transfer on Noise Figure in Silicon Raman Amplifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xinzhu Sang ; Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA ; Dimitropoulos, D. ; Jalali, B. ; Boyraz, O.

The effect of the relative intensity noise (RIN), transferred from the pump to the signal, in 1-cm-long chip scale silicon Raman amplifiers is investigated in the presence of nonlinear losses. We show that due to the short waveguide length, the reduction in fluctuations that normally occurs due to ldquowalk-offrdquo between pump and signal waves in fiber amplifiers is inefficient in chip scale Raman amplifiers. In the counterpropagating pump configuration, which leads to minimum frequency RIN transfer, fluctuations up to 1.5 GHz are transferred from the pump to the signal. As a case study, the noise figure degrades by as much as 11 dB in the silicon waveguide with the free carrier life time of 0.1 ns, when it is pumped with a laser with a RIN value of -125 dB/Hz.

Published in:

Photonics Technology Letters, IEEE  (Volume:20 ,  Issue: 24 )

Date of Publication:

Dec.15, 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.