By Topic

PEEC Formulation Based on Dyadic Green's Functions for Layered Media in the Time and Frequency Domains

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kochetov, S.V. ; Inst. for Fundamental Electr. Eng. & Electromagn. Compatibility, Otto-von-Guericke Univ. Magdeburg, Magdeburg ; Leone, M. ; Wollenberg, G.

This paper presents a novel time- and frequency-domain concept of modeling with the partial element equivalent circuit (PEEC) method, which applies the mixed potential integral equation (MPIE) with dyadic Green's functions for layered media (DGFLM-PEEC). On the one hand, it represents an exact full-wave semianalytical solution for an arbitrary configuration of traces and via holes in multilayered printed circuit boards. On the other hand, the DGFLM-PEEC model is represented in a circuit form, and thus, may be included in general-purpose circuit simulators. The paper derives a general DGFLM-PEEC formulation, which may be applied to all types of the MPIE with dyadic Green's functions. Using this concept, a particular type of layered media, namely a lossy dielectric between two grounds (stripline region), is thoroughly investigated and used to set up a particular DGFLM-PEEC model. The closed-form expressions for partial inductances and potential coefficients have been derived for this case. The time- and frequency-domain DGFLM-PEEC models for the stripline region have been validated using the measurements and the simulation by the method of moments.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:50 ,  Issue: 4 )