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Design approaches for developing a high density, high performance analog test instrument

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1 Author(s)
David Kaushansky ; Teradyne, Assembly Test Division, 700 Riverpark Drive, North Reading, Ma 01864, USA

This paper describes the techniques and technologies used to create a high performance, high density, multi-functional analog test instrument. Overcoming density challenges, while maintaining optimal performance levels, requires the careful selection of parts in order to balance functionality, power dissipation, and board area. This paper discusses technologies such as a custom analog ASIC, semi-custom cooling, programmable digital logic, and PCB materials, and how these elements combine to result in a highly functional analog test design in a minimized footprint.

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8-11 Sept. 2008