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An XML-based test development and deployment framework for mixed-signal and digital devices

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2 Author(s)
Mellik, A. ; Dept. of Electron., TTU, Tallinn ; Raik, J.

A framework is proposed to shorten the test development and deployment times and to ensure test data integrity throughout the life-cycle of an IC. The approach targets both digital and mixed-signal devices by employing a number of existing tools and technologies, while also enabling cross-academia and -industry research and development on described test-process-related issues, by enabling an actual distributed technical setting. As an add-on, yield analysis capabilities emerge from the technical setting.

Published in:

AUTOTESTCON, 2008 IEEE

Date of Conference:

8-11 Sept. 2008