By Topic

A linear sampling approach to crack detection in microwave imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Bozza, G. ; Dept. of Biophys. & Electron. Eng., Univ. of Genoa, Genoa ; Brignone, M. ; Pastorino, M. ; Piana, M.
more authors

In this contribution a new approach for inspecting crack and defects in known structures by using microwaves is presented. The novelty consists in using a new formulation of the linear sampling method called the no sampling linear sampling method to invert the scattered data, which results to be particularly fast and effective. Such a technique belongs to the category of qualitative methods and is able to retrieve position and shape of anomalies inside a known structure, but it does not provide any information on the point values of the dielectric parameters of the defects. In the paper the formulation of the problem and the new version of the linear sampling method are outlined and some numerical results are provided to assess the proposed approach.

Published in:

Imaging Systems and Techniques, 2008. IST 2008. IEEE International Workshop on

Date of Conference:

10-12 Sept. 2008