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In this contribution a new approach for inspecting crack and defects in known structures by using microwaves is presented. The novelty consists in using a new formulation of the linear sampling method called the no sampling linear sampling method to invert the scattered data, which results to be particularly fast and effective. Such a technique belongs to the category of qualitative methods and is able to retrieve position and shape of anomalies inside a known structure, but it does not provide any information on the point values of the dielectric parameters of the defects. In the paper the formulation of the problem and the new version of the linear sampling method are outlined and some numerical results are provided to assess the proposed approach.