Cart (Loading....) | Create Account
Close category search window
 

Complete Design and Measurement Methodology for a Tunable RF Impedance-Matching Network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Hoarau, C. ; Microwave & Characterization Lab., Inst. of Microelectron., Grenoble ; Corrao, N. ; Arnould, J.-D. ; Ferrari, P.
more authors

This paper presents the design, fabrication, and characterization of a compact narrowband tunable impedance-matching network. A prototype was fabricated in hybrid technology using coplanar waveguide transmission lines and surface-mounted components. The network consists of a II-structure with tunable components made of varactors in series with inductors. Simulations and measurements are in good agreement. A new measurement methodology suitable for tunable impedance-matching networks is proposed. The results show that complex impedances with magnitudes varying from 6 Omega to 1 kOmega can be matched at 1 GHz and tuned in a 50% bandwidth. In addition, nonlinear measurements were done to fully characterize the network. The 1-dB compression point is reached at an input power of 20 dBm, while the input power for the third-order intermodulation intercept point is 21.3 dBm for a 1-kHz offset between the two input frequencies.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:56 ,  Issue: 11 )

Date of Publication:

Nov. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.