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Browse Journals & Magazines > Optoelectronics, IEE Proceedi ...> Volume:135 Issue:4 Help

Microwave simulation of optoelectronic bending loss in presence of dielectric discontinuity

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3 Author(s)
Benson, T.M. ; University College, Department of Electrical and Electronic Engineering, Cardiff, UK ; Kendall, P.C. ; Stern, M.S.

A theory is developed and compared with experimental results. The theory enables calculation of the curvature loss from a partially buried dielectric waveguide in the presence of a strong air/dielectric planar interface. Comparison is made between numerical predictions based on this theory and experimental results for a smooth waveguide of rectangular cross-section. Agreement is found to be striking, even when the position of the caustic should, in theory, render the waveguide lossy.

Published in:
Optoelectronics, IEE Proceedings J  (Volume:135 ,  Issue: 4 )

Date of Publication: August 1988

Page(s):
325 - 331
ISSN :
0267-3932
Digital Object Identifier :
10.1049/ip-j:19880061
Product Type:
Journals & Magazines
Date of Current Version :
11 November 2008
Issue Date :
August 1988

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