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NDT applications of scanning acoustic microscopy

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1 Author(s)
Burton, Nigel J. ; VG Semicon Ltd., The Birches Industrial Estate, East Grinstead, UK

The scanning acoustic microscope is becoming an important new tool for nondestructive testing. The paper concentrates on the current application of the technique and recent developments in instrumentation relevant to the NDT field: an area not well covered in the literature

Published in:

Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A  (Volume:134 ,  Issue: 3 )