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The purpose of the paper is to review the current status of testing as it relates to printed circuit boards (PCBS) that contain digital LSI and VLSI devices such as a microprocessor. The paper tackles four main subjects: major problems caused by the use of complex devices on PCBSs; techniques for testing specific devices; general-purpose test strategy for PCBs containing complex devices; guidelines and design strategy for testable designs. The paper references 108 other publications available in the open literature.
Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A (Volume:128 , Issue: 7 )
Date of Publication: October 1981