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A complete process is described whereby on-chip mirrors may be fabricated in Ti : LiNbO3 stripe waveguide devices using micro-focal ion-beam machining. Experimental results are presented for a device operating at 1.523 Â¿m wavelength, TM mode. An interferometric technique is used to distinguish the reflection from the on-chip mirror from other spurious reflections. Approximately 24% power reflectivity is observed. Results are compared with a simple theoretical model of the chip response under different conditions, and good agreement is obtained.