Cart (Loading....) | Create Account
Close category search window

Simplified hybrid optical model for RWL threshold current optimisation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Baralis, E. ; Politecnico di Torino, Dipartimento di Elettronica, Torino, Italy ; Bianco, A. ; Bava, G.P. ; Montrosset, I.

A numerically efficient model for the evaluation of InGaAsP ridge waveguide laser operation at threshold is presented. It includes the treatment of the electrical behaviour of the junction and an `hybrid¿¿ optical waveguide analysis that approximately takes into account the coupling between TE and TM modes at the ridge interfaces. The adopted optical model is slightly more complex than the effective refractive index method and the electrical model gives an almost analytical solution; this allows the use of optimisation routines in designing structures which present minimum threshold current. Numerical results that highlight the advantages of this method in the optical modal analysis are reported and three widely used laser structures are numerically analysed and compared.

Published in:

Optoelectronics, IEE Proceedings J  (Volume:134 ,  Issue: 1 )

Date of Publication:

February 1987

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.