By Topic

Approach for determining a reliable set of spot frequencies to be used during a Sweep Frequency Response Analysis (SFRA) for power transformer diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Secue, J. ; Inst. de Energia Electr., Univ. Nac. de San Juan, San Juan ; Mombello, E. ; Muela, E.

The measurement of the frequency response on power and distribution transformers is a diagnostic test technique for detecting winding displacement and deformation (among other mechanical and electrical failures), which are among the most important causes of mechanical failure in transformers. There are two different methods to carry out the measurement of frequency response: sweep frequency response analysis - SFRA and low voltage impulse - LVI. SFRA presents some important advantages over LVI such as: higher signal to noise ratio, bigger repeatability and reproducibility and less requirements regarding measurement equipment. An important disadvantage of the SFRA with respect to LVI is the time required for the measurement. The necessary time for performing an SFRA test (typically several minutes) is related to the bandwidth and number of spot frequencies, which are not universally defined. This paper presents an approach for determining a reliable number of spot frequencies in order to make a further diagnosis.

Published in:

Transmission and Distribution Conference and Exposition: Latin America, 2008 IEEE/PES

Date of Conference:

13-15 Aug. 2008