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TID and SEE Response of Advanced 4G NAND Flash Memories

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12 Author(s)
Oldham, T.R. ; Perot Syst. Gov. Services, Inc., Greenbelt, MD ; Suhail, M. ; Friendlich, M.R. ; Carts, M.A.
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We present total dose and SEE responses for 4G NAND flash memories by three different manufacturers. The SEE response is scaled to predict the response to atmospheric neutrons at aircraft altitudes and at sea level using the figure of merit.

Published in:

Radiation Effects Data Workshop, 2008 IEEE

Date of Conference:

14-18 July 2008