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Study of Single-Event Transients in High-Speed Operational Amplifiers

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4 Author(s)
Jaulent, P. ; IMS Lab., Univ. of Bordeaux, Talence ; Pouget, V. ; Lewis, D. ; Fouillat, P.

This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 4 )