By Topic

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Berg, M. ; Goddard Space Flight Center, MEI Technol., NASA, Greenbelt, MD ; Poivey, C. ; Petrick, D. ; Espinosa, D.
more authors

A comparison of two scrubbing mitigation schemes for Xilinx field programmable gate array devices is presented. The design of the scrubbers is briefly discussed along with an examination of mitigation limitations. Heavy ion data are then presented and analyzed.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:55 ,  Issue: 4 )