By Topic

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Alegria, F.C. ; Inst. de Telecomun./Inst. Super. Tecnico, Tech. Univ. of Lisbon, Lisbon ; Cruz Serra, A.

Two of the parameters that are determined when testing an analog-to-digital converter (ADC) are the gain and offset errors. One of the ways to define these two parameters is called ldquoindependently based.rdquo In this paper, we derive the precision of the gain and offset errors estimated with the histogram test method affected by additive noise.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:58 ,  Issue: 3 )