Close category search window
 

Coupled field-circuit-mechanical model of an electromagnetic actuator operating in error actuated control system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Nowak, L. ; Inst. of Electr. & Electron. Eng., Poznan Univ. of Technol., Poznan

An algorithm of coupled field-circuit simulation of the dynamics of an electromagnetic linear actuator operating in error actuated control system is presented. The software consists of three main parts: (a) numerical model of the actuator dynamics which includes equations of a transient electromagnetic field in a non-linear conducting and moving medium, (b) discrete model of electric circuit and (c) optimization solver. Numerical implementation is based on the finite elements. The influence of the PID controller settings on the actuator operation is shown. In order to find optimal parameters of the system the genetic algorithm is applied. The simultaneous optimization of both: actuator structure and regulator settings has been carried out.

Published in:
Power Electronics and Motion Control Conference, 2008. EPE-PEMC 2008. 13th

Date of Conference: 1-3 Sept. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.