Cart (Loading....) | Create Account
Close category search window
 

Interactive SIMD ray tracing for large deformable tetrahedral meshes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Gross, M. ; Int. Res. & Training Group, Fraunhofer ITWM, Kaiserslautern ; Hagen, H. ; Pfreund, F.-J.

We introduce an interactive ray tracing method for large deformable tetrahedral meshes which has carefully been designed for supporting general single instruction multiple data (SIMD) operations. It uses memory aligned and SIMD-friendly hierarchical acceleration structures and tetrahedron acceleration data allowing SIMD ray traversal and a newly proposed SIMD barycentric tetrahedron-plane intersection test. The method is very general and allows volume-, opaque- and accelerated (semi) iso surface-rendering as well as visualizing multidimensional data. It scales for static data sets sublinear to data size, such that it is well suited for visualizing massive data sets. The method is also very portable and not restricted to specialized hardware, such that it natively supports near future hardware which will be many core architectures supporting up to 512-bit register operations, allowing for each core to trace up to 16 rays at once through the mesh.

Published in:

Interactive Ray Tracing, 2008. RT 2008. IEEE Symposium on

Date of Conference:

9-10 Aug. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.