Skip to Main Content
This paper presents an efficient technique for the evaluation of different types of losses in substrate integrated waveguide (SIW). This technique is based on the Boundary Integral-Resonant Mode Expansion (BI-RME) method in conjunction with a perturbation approach. This method also permits to derive automatically multimodal and parametric equivalent circuit models of SIW discontinuities, which can be adopted for an efficient design of complex SIW circuits. Moreover, a comparison of losses in different types of planar interconnects (SIW, microstrip, coplanar waveguide) is presented.