Cart (Loading....) | Create Account
Close category search window

Fuzzy logic based assignable causes ranking system for control chart abnormity diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hou Shiwang ; Sch. of Manage., Northwestern Polytech. Univ., Xi''an ; Tong shurong

When using control chart patterns as signals to identify the cause for faster and easier process diagnosis, tradition method is hard to handle with the uncertainties, ambiguities and vagueness associated with the problem. Based on fuzzy logic, this paper develops a fuzzy inference system (FIS), composed by six sub modules. Each determines the intensity of corresponding causes based on degree of presence of each pattern. All the evidence supporting each cause from the unnatural patterns are aggregated using fuzzy connective operators and causes are prioritized according to the final aggregating results. The search can be done from the cause having highest priority when process goes out of control.

Published in:

Fuzzy Systems, 2008. FUZZ-IEEE 2008. (IEEE World Congress on Computational Intelligence). IEEE International Conference on

Date of Conference:

1-6 June 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.