Close category search window
 

Dimension Estimation in Noisy PCA With SURE and Random Matrix Theory

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ulfarsson, M.O. ; Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI ; Solo, V.

Principal component analysis (PCA) is one of the best known methods for dimensionality reduction. Perhaps the most important problem in using PCA is to determine the number of principal components (PCs) or equivalently choose the rank of the loading matrix. Many methods have been proposed to deal with this problem but almost all of them fail in the important practical case when the number of observation is comparable to the number of variables, i.e., the realm of random matrix theory (RMT). In this paper we propose to use Stein's unbiased risk estimator (SURE) to estimate, with some assistance from RMT, the number of principal components. The method is applied both on simulated and real functional magnetic resonance imaging (fMRI) data, and compared to BIC and the Laplace method.

Published in:
Signal Processing, IEEE Transactions on  (Volume:56 ,  Issue: 12 )

Date of Publication: Dec. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.