By Topic

Pattern Verification-Based Increment Memory Testing Method for Safety-Critical System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Zhi Yao Deng ; Dept. of Software Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu ; Nan Sang

Safety-critical system (SCS) has highly demand for the dependability, which requires plenty of resource to ensure the system under test (SUT) satisfy the dependability requirement. Nowadays few of testing approach can efficiently cover the dependability of SUT. This paper proposes a new SCS testing method to improve SCS adaptive dependability testing, which integrates two strategies: the verification pattern and the incremental memory model. This new method generates the test cases by the verification pattern definition and makes evaluating calculation by setting memory unit to record the failure events. Then the least quantity of scenario test case for next test execution will be calculated according to the promised SUTpsilas confidence level. In this way, the feedback data is generated to weight controller as the guideline for the further testing. Finally, a comprehensive experiment study demonstrates that this adaptive testing method can really work in practice. This rapid testing method, pattern and testing statistics-based adaptive control, makes the SCS dependability testing much more effective.

Published in:

Embedded Software and Systems Symposia, 2008. ICESS Symposia '08. International Conference on

Date of Conference:

29-31 July 2008