Cart (Loading....) | Create Account
Close category search window
 

Match Sensing Using Match-Line Stability in Content-Addressable Memories (CAM)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tyshchenko, O. ; Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON ; Sheikholeslami, A.

This paper presents a match-line (ML) sensing scheme that distinguishes a match from a miss by first shunting every ML with a fixed negative resistance, then exciting the MLs with an initial charge, and subsequently observing their voltage developments. It is shown that the voltage on the matched ML will grow to VDD as in an unstable system, whereas the voltage on a missed ML will decay to zero, as in a stable system. Since the initial excitation charge on the ML's can be as low as the noise level in the system, this scheme can approach the minimum possible energy consumption level for match-line sensing. We have implemented, in 0.18 mum CMOS, a 144 times 144 ternary CAM array that includes the stability-based sensing scheme along with two previously-reported sensing schemes. The measured results confirm the power savings of the proposed sensing scheme. In addition, the CAM includes a pipelined search-line (SL) architecture that can reduce the SL portion of CAM power by up to 50%.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:43 ,  Issue: 9 )

Date of Publication:

Sept. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.