Cart (Loading....) | Create Account
Close category search window

An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Mukhopadhyay, S. ; Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA ; Keunwoo Kim ; Jenkins, K.A. ; Ching-Te Chuang
more authors

This paper presents an on-chip characterization method for random variation in minimum sized devices in nanometer technologies, using a sense amplifier-based test circuit. Instead of analog current measurements required in conventional techniques, the presented circuit operates using digital voltage measurements. Simulations of the test structure using predictive 70 nm and hardware based 0.13 mum CMOS technologies show good accuracy (error ~5%-10%) in the prediction of random variation even in the presence of systematic variations. A test chip is fabricated in 0.13 mum bulk CMOS technology and measured to demonstrate the operation of the test structure.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:43 ,  Issue: 9 )

Date of Publication:

Sept. 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.