By Topic

Thermal and Electrical Transport in Carbon Nanofiber Interconnects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Tsutomu Saito ; Center for Nanostruct., Santa Clara Univ., Santa Clara, CA ; Hirohiko Kitsuki ; Makoto Suzuki ; Toshishige Yamada
more authors

To carry out a systematic reliability study of carbon nanofibers (CNFs) under high-current stress, detailed electrical analysis of CNF breakdown is performed on four configurations using current annealing. This investigation can be described with a heat transport model that takes into account Joule heating and heat dissipation along the CNF, and assuming that breakdown occurs where the temperature reaches a threshold or critical value.

Published in:

2008 8th IEEE Conference on Nanotechnology

Date of Conference:

18-21 Aug. 2008