Cart (Loading....) | Create Account
Close category search window
 

Investigating the impact of carbon nanotube-based driver transistors on the performance of single-walled carbon nanotube interconnect

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ragheb, T. ; Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX ; Nieuwoudt, A. ; Massoud, Y.

In this paper, we investigate the performance of on-chip interconnect constructed using hybrid systems containing both single-walled carbon nanotube (SWCNT) based driver transistors and SWCNT bundle-based wires. Leveraging an equivalent circuit model for SWCNT bundle-based interconnect and a semi-empirical model for both N-type and P-type carbon nanotube field effect transistors (CNTFET), we predict the performance of hybrid systems of nanotube-based devices and interconnect using circuit-level simulation. The results indicate that hybrid nanotube-based driver/interconnect systems can potentially provide a substantial delay reduction over standard CMOS buffers and copper interconnect implemented in 22 nm process technology. Finally, we examine the reliability implications of parasitic metallic nanotubes in CNTFET-based driver circuits and find that even a small number of parasitic metallic nanotubes can lead to logic failures, which underscores the need for tight process control when manufacturing CNTFETs.

Published in:

Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on

Date of Conference:

10-13 Aug. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.