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Reliability study of single-poly floating gates in 0.13 μm CMOS for use in field programmable analog arrays

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5 Author(s)
Henrici, F. ; Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg ; Peters, C. ; Becker, J. ; Ortmanns, M.
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This paper explores the reliability of single-poly floating gates in 0.13 mum CMOS technology. Charge retention times before and after wear-out are measured. Channel interface degradation is evaluated through flicker noise measurements. The results show that deep submicron single-poly floating gates can store analog information with high precision for several months. While this disqualifies them from storing information for the life-time of a chip, it makes them a viable alternative to digital-to-analog converter arrays for tuning a set of parameters in field programmable analog arrays.

Published in:

Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on

Date of Conference:

10-13 Aug. 2008