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High-speed electron beam testing using an electron-optical phase shift element

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3 Author(s)
Thong, J.T.L. ; Dept. of Eng., Cambridge Univ., UK ; Breton, B.C. ; Nixon, W.C.

An electron-optical element has been developed which delays electron pulses with continuous phase shift resolution. The inherently jitter-free method relies on the change of beam potential over a length of the optical path to modify the electron pulse transit time. Direct pulse measurements using 5 ps pulses demonstrate subpicosecond resolved delays while waveforms have been measured on coplanar lines

Published in:

Electronics Letters  (Volume:24 ,  Issue: 23 )