Cart (Loading....) | Create Account
Close category search window
 

Doctored JPEG image detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Weihai Li ; MOE-Microsoft Key Lab. of Multimedia Comput. & Commun., Univ. of Sci. & Technol. of China, Hefei ; Nenghai Yu ; Yuan Yuan

Nowadays, digital images can be easily modified by using software. In this paper, a new blind approach is proposed to detect copy-paste trail in a doctored JPEG image, i.e., to check whether a copied area came from the same image or not. When a copy-paste procedure is done on an image, especially adding or hiding an object, the block artifact grid contained in the copy-pasted slice is moved together. Since a slice must be placed properly in the target image to avoid obvious vision flaw, the grid in the slice mismatches to the original grid in the target image normally. Our approach utilizes the mismatch information of block artifact grid as a clue of copy-paste forgery. Experiment results demonstrate the efficiency of the proposed approach.

Published in:

Multimedia and Expo, 2008 IEEE International Conference on

Date of Conference:

June 23 2008-April 26 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.