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Cu out-diffusion kinetics in pre-plated Cu-alloy leadframes investigated by a developed EDX-based oxidation test

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4 Author(s)
Liu, Lilin ; Sch. of Phys. & Eng., Sun Yat-Sen Univ., Guangzhou ; Fu, Ran ; Deming Liu ; Zhang, Tong-Yi

The energy dispersive X-ray (EDX)-based permeation and oxidation test has been further developed by a novel theoretical analysis, in which the gradient of chemical potential rather than the concentration gradient is employed. The EDX-based permeation and oxidation tests determine Cu flux coefficients in the CuO oxide layers to be 4.17times10-26 molldr(mldrsldrkJ/mol)-1exp(-70.30 kJldrmol-1/RT) in temperature range of 250 degC - 400 degC. And the Cu flux coefficients in the Ni layers are 1.72times10-32 molldr(mldrsldrkJ/mol)-1 and 5.92times10-32 molldr(mldrsldrkJ/mol)-1 at temperatures of 250 degC and 300 degC, respectively.

Published in:

Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on

Date of Conference:

28-31 July 2008