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This paper presents a combinational test generation method for transition faults in acyclic sequential circuits. In this method, to generate test sequences for transition faults in a given acyclic sequential circuit is performed on its extend time-expansion model. The model is composed of two copies of time-expansion model of the given circuit and extends in the close two sequences to generate 2 vectors for the transition faults with some restrictions. Experimental results show the method can achieve the higher fault efficiency with the lower test generation times than conventional method.
Date of Conference: 28-31 July 2008