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This paper presents a combinational test generation method for transition faults in acyclic sequential circuits. In this method, to generate test sequences for transition faults in a given acyclic sequential circuit is performed on its extend time-expansion model. The model is composed of two copies of time-expansion model of the given circuit and extends in the close two sequences to generate 2 vectors for the transition faults with some restrictions. Experimental results show the method can achieve the higher fault efficiency with the lower test generation times than conventional method.
Published in:
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Date of Conference: 28-31 July 2008
- Page(s):
- 1 - 5
- E-ISBN :
- 978-1-4244-2740-6
- Print ISBN:
- 978-1-4244-2739-0
- INSPEC Accession Number:
- 10206014
- Conference Location :
- Shanghai
- Digital Object Identifier :
- 10.1109/ICEPT.2008.4607015
- Product Type:
- Conference Publications
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