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Combinational test generation for transition faults in acyclic sequential circuits

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3 Author(s)
Shi Hui ; Key Lab. of Adv. Displays & Syst. Applic., Shanghai Univ., Shanghai ; Ran Feng ; Zhang Jinyi

This paper presents a combinational test generation method for transition faults in acyclic sequential circuits. In this method, to generate test sequences for transition faults in a given acyclic sequential circuit is performed on its extend time-expansion model. The model is composed of two copies of time-expansion model of the given circuit and extends in the close two sequences to generate 2 vectors for the transition faults with some restrictions. Experimental results show the method can achieve the higher fault efficiency with the lower test generation times than conventional method.

Published in:

Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on

Date of Conference:

28-31 July 2008

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