IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Innovative Computing Informat ... Help

Rough Vague Sets Based on General Binary Relation and Its Method of Similarity Measures

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Qinpeng Cai ; Dept. of Math., Hainan Normal Univ., Haikou ; Shengquan Ma

This paper introduces the approximate problem of the common relation Vague sets. Based on our previously study and analysis the connection among the classical rough sets theory, fuzzy sets theory and vague sets theory, we canonically discuss the conception and correlative properties of rough vague sets under the common relationship and also present the measurement method in measuring the similarity of two rough vague sets. This possesses certain significance in further research of the rough vague set.

Published in:
Innovative Computing Information and Control, 2008. ICICIC '08. 3rd International Conference on

Date of Conference: 18-20 June 2008

Page(s):
497
E-ISBN :
978-0-7695-3161-8
Print ISBN:
978-0-7695-3161-8
INSPEC Accession Number:
10185007
Conference Location :
Dalian, Liaoning
Digital Object Identifier :
10.1109/ICICIC.2008.483
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.