Cart (Loading....) | Create Account
Close category search window
 

A Fast and Accurate Amplitude-Only Transmission-Reflection Method for Complex Permittivity Determination of Lossy Materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hasar, U.C. ; Dept. of Electr. & Electron. Eng., Ataturk Univ., Erzurum

Complex scattering parameter measurements using expensive vector network analyzers make microwave techniques inconvenient for industrial-based applications. In industry, accurate and fast evaluation of materials' properties using a relatively inexpensive measurement setup is a key issue. In this paper, we derive an objective function for fast and accurate complex permittivity (epsiv) determination of lossy materials using amplitude-only reflection and transmission scattering parameter measurements. The measurements can be carried out by relatively inexpensive microwave instruments such as a scalar network analyzer. The domain for computations of the epsiv is significantly reduced to facilitate rapid epsiv determination. The objective function is verified by measurements of a commercially available antifreeze solution and binary mixture of ethyl alcohol and water solution.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:56 ,  Issue: 9 )

Date of Publication:

September 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.