Cart (Loading....) | Create Account
Close category search window
 

Ulcer recognition in capsule endoscopy images by texture features

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Baopu Li ; Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong ; Meng, M.Q.-H.

The capsule endoscopy (CE) has gradually found its applications in hospitals because of its great advantage that it can view the entire small bowel with almost no invasiveness compared to traditional endoscopes and other imaging techniques for gastrointestinal diseases. However, a major issue with this new technology is that too many images produced by CE causes a huge burden to physicians, so it is very meaningful to help the clinicians if we could partially implement computer aided diagnosis. We proposed a new scheme aimed for ulcer region discrimination in CE images in this paper. This new scheme utilizes texture feature, a very powerful clue for the physicians to diagnose, to recognize ulcer regions with neural network classifier. We advance a new idea of curvelet based local binary pattern as the textural features to discriminate ulcer regions from normal regions, which make full use of the curvelet transform and uniform local binary pattern. Experiments on our present image data sets validate that it is promising to employ the proposed texture features to recognize the ulcer regions.

Published in:

Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on

Date of Conference:

25-27 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.