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Impact of microgrids concept on low voltage network reliability

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3 Author(s)
Liang Tao ; Siemens AG, Berlin ; Schwaegerl, C. ; Herrmann, N.

A collection of slides from the authorpsilas conference presentation is given.

Published in:

SmartGrids for Distribution, 2008. IET-CIRED. CIRED Seminar

Date of Conference:

23-24 June 2008