By Topic

Breakdown strength of solid dielectrics in liquid nitrogen

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Masood, A. ; Dept. of Electr. Eng., Aligarh Muslim Univ., Aligarh ; Zuberi, M.U. ; Husain, E.

The objective of this research was to determine if a relationship could be found between dielectric strength and other properties of electrical insulating materials in the medium of liquid nitrogen on an empirical basis by using variables predicted by basic theory. A simple equation of the form E=A+Blog (rhov/xir tandelta) to predict the dielectric strength of a solid insulating material in liquid nitrogen medium has been proposed. The equation requires the values of volume resistivity (rhov), relative permittivity (xir) and loss tangent (tandelta) in the medium of liquid nitrogen, which may be obtained easily by low voltage non-destructive measurements. The values of electric strength calculated using this equation for Crepe paper, Kraft paper, varnished paper, pressboard, presspahn, mica, bakelite and asbestos are quite in agreement with the experimentally measured values. It is expected that the equations obtained will help the designers as a handy tool for quick estimation of breakdown strength of solid dielectrics dipped in liquid nitrogen.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:15 ,  Issue: 4 )