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Implementing the grayscale wave metric on a cellular array processor chip

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2 Author(s)
Daniel Hillier ; Jedlik Laboratory, Faculty of Information Technology, Péter Pázmány Catholic University, 1083 Budapest, Práter u. 50/a, Hungary ; Piotr Dudek

Algorithms designed for machine vision applications such as medical imaging, surveillance, etc., very often require some kind of comparison between images. The non-linear wave metric can measure both the shape and the area difference between two objects in one single operation. We present the implementation of the wave metric on the SCAMP chip that combines the benefits of a highly selective metric with high speed, efficient execution.

Published in:

2008 11th International Workshop on Cellular Neural Networks and Their Applications

Date of Conference:

14-16 July 2008