Referenced Items are not available for this document.
Algorithms designed for machine vision applications such as medical imaging, surveillance, etc., very often require some kind of comparison between images. The non-linear wave metric can measure both the shape and the area difference between two objects in one single operation. We present the implementation of the wave metric on the SCAMP chip that combines the benefits of a highly selective metric with high speed, efficient execution.
Published in:
Cellular Neural Networks and Their Applications, 2008. CNNA 2008. 11th International Workshop on
Date of Conference: 14-16 July 2008
- Page(s):
- 120 - 124
- E-ISBN :
- 978-1-4244-2090-2
- Print ISBN:
- 978-1-4244-2089-6
- INSPEC Accession Number:
- 10116974
- Conference Location :
- Santiago de Compostela
- Digital Object Identifier :
- 10.1109/CNNA.2008.4588662
- Product Type:
- Conference Publications
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