Cart (Loading....) | Create Account
Close category search window

EMMI analysis on silicon solar cell

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yeh, B. ; Mater. Anal. Technol. Inc., Hsinchu ; Huang, R. ; Chung, K. ; Chang, A.
more authors

This work utilized the EMMI as a tool for investigation of the junction leakage of crystalline silicon solar cell under reverse bias and forward bias. The defected areas were examined by the TEM to reveal the physical structure. In addition, analysis of physical structure and component of the solar cell were demonstrated by using common PFA tools, such as OM, SEM, EDX, FIB, and TEM.

Published in:

Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the

Date of Conference:

7-11 July 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.