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Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure

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8 Author(s)
A. Machouat ; STMicroelectronics, 190 Avenue Célestin Coq, 13106 Rousset, France ; G. Haller ; V. Goubier ; D. Lewis
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Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve accuracy of fault isolation and defect localization.

Published in:

2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Date of Conference:

7-11 July 2008