Close category search window
 

A theoretical analysis of linear and multi-linear models of image appearance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yilei Xu ; Dept. of Electr. Eng., California Univ., Riverside, CA ; Roy-Chowdhury, A.K.

Linear and multi-linear models of object shape/appearance (PCA, 3 DMM, AAM/ASM, multilinear tensors) have been very popular in computer vision. In this paper, we analyze the validity of these models from the fundamental physical laws of object motion and image formation. We rigorously prove that the image appearance space can be closely approximated to be locally multilinear, with the illumination subspace being bilinearly combined with the direct sum of the motion, deformation and texture subspaces. This result allows us to understand theoretically many of the successes and limitations of the linear and multi-linear approaches existing in the computer vision literature, and also identifies some of the conditions under which they are valid. It provides an analytical representation of the image space in terms of different physical factors that affect the image formation process. Experimental analysis of the accuracy of the theoretical models is performed as well as tracking on real data using the analytically derived basis functions of this space.

Published in:
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on

Date of Conference: 23-28 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.