By Topic

Semi-supervised distance metric learning for Collaborative Image Retrieval

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Steven C. H. Hoi ; School of Computer Engineering, Nanyang Technological University, Singapore ; Wei Liu ; Shih-Fu Chang

Typical content-based image retrieval (CBIR) solutions with regular Euclidean metric usually cannot achieve satisfactory performance due to the semantic gap challenge. Hence, relevance feedback has been adopted as a promising approach to improve the search performance. In this paper, we propose a novel idea of learning with historical relevance feedback log data, and adopt a new paradigm called ldquoCollaborative Image Retrievalrdquo (CIR). To effectively explore the log data, we propose a novel semi-supervised distance metric learning technique, called ldquoLaplacian Regularized Metric Learningrdquo (LRML), for learning robust distance metrics for CIR. Different from previous methods, the proposed LRML method integrates both log data and unlabeled data information through an effective graph regularization framework. We show that reliable metrics can be learned from real log data even they may be noisy and limited at the beginning stage of a CIR system. We conducted extensive evaluation to compare the proposed method with a large number of competing methods, including 2 standard metrics, 3 unsupervised metrics, and 4 supervised metrics with side information.

Published in:

Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on

Date of Conference:

23-28 June 2008